搜索包含 Symposium on Anomalies 的图书 - 暨南大学图书馆

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	Digest of papers : 1973 symposium on semiconductor memory testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N. J. 0 索取号：TN304.07-53/E801/1973 作者：Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、出版社：New York : IEEE, c1973.		Image science mathematics 0 索取号：TN27-53/E801 作者：Symposium on Current Mathematical Problems in Image Science (1976 : Monterey、 Calif.)、Wilde、 Carroll O.、Barrett、 Eamon.、出版社：North Hollywood, Calif. : Western Periodicals Co., 1977.
	The accuracy of flow measurements by laser doppler methods : proceedings of the LDA-Symposium Copenhagen, 1975 0 索取号：TN249-53/E805/1975 作者：LDA-Symposium、 Technical University of Denmark、 1975.、Buchhave、 Preben.、Copenhagen. Polyteknisk l´reanstalt.、出版社：Skovlunde : Proceedings LDA-Symposium Copenhagen 1975, 1976.		Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971 0 索取号：TN14-53/E801/11 作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、出版社：San Francisco, Calif. : San Francisco Press, c1971.
	Record of the 10th symposium on electron, ion, and laser beam technology 0 索取号：TN14-53/E801/10 作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、出版社：San Francisco : San Francisco Press, [c1969].		Proceedings 0 索取号：TN1-53/E906 作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
	1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
	Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.		Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
	Statistical sampling : past, present, and future theoretical and practical 0 索取号：作者：Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、出版社：Philadelphia, PA : ASTM, c1990.		1975 IEEE MTT-S International Microwave Symposium : digest of technical papers 0 索取号：TN019.2-7/E801/1975 作者：IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、出版社：Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975
	1972 IEEE - GMTT International Microwave Symposium : Digest of technical papers, May 22-24, 1972, Arlington Park Towers Hotel, Arlington Heights, IL 0 索取号：TN019.2/E806/1972 作者：IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、出版社：New York : Institute of Electrical and Electronics Engineers, 1972.		Semiconductor silicon 1977 : proceedings of the third International Symposium on Silicon Materials Science and Technology 0 索取号：TN304.1-53/E801/3 作者：International Symposium on Silicon Materials Science and Technology (3rd : 1977 : Philadelphia、 Pa.)、Huff、 Howard R.、Sirtl、 Erhard.、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、出版社：Princeton, N.J. : Electronics and Electrothermics and Metallurgy Divisions, Electrochemical Society, c1977.
	Boron: synthesis, structure, and properties : proceedings of the conference on Boron 0 索取号：TN304.16-53/E701 作者：International Symposium on Boron (1st : 1959 : Asbury Park、 N.J.)、GauĺЕ、 G. K. (Gerhart K.)、Nye、 W. F. (William Frederick)、 1917-、Kohn、 J. A. (Jack Arnold)、 1925-、　Institute for Exploratory Research (U.S.)、出版社：New York : Plenum Press, 1960.		Organic and polymetric materials and devices--optical, electrical and optoelectronic properties : symposium held April 1-5, 2002, San Francisco, California, U.S.A. 0 索取号：TN304.52/E20041 作者：出版社：Pittsburgh, Pa. : Materials Research Society, c2002.

	Digest of papers : 1973 symposium on semiconductor memory testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N. J. 0 索取号：TN304.07-53/E801/1973 作者：Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、出版社：New York : IEEE, c1973.		Image science mathematics 0 索取号：TN27-53/E801 作者：Symposium on Current Mathematical Problems in Image Science (1976 : Monterey、 Calif.)、Wilde、 Carroll O.、Barrett、 Eamon.、出版社：North Hollywood, Calif. : Western Periodicals Co., 1977.
	The accuracy of flow measurements by laser doppler methods : proceedings of the LDA-Symposium Copenhagen, 1975 0 索取号：TN249-53/E805/1975 作者：LDA-Symposium、 Technical University of Denmark、 1975.、Buchhave、 Preben.、Copenhagen. Polyteknisk l´reanstalt.、出版社：Skovlunde : Proceedings LDA-Symposium Copenhagen 1975, 1976.		Record of the 11th Symposium on Electron, Ion, and Laser Beam Technology : Boulder, Colorado, 12-14 May 1971 0 索取号：TN14-53/E801/11 作者：Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、出版社：San Francisco, Calif. : San Francisco Press, c1971.
	Record of the 10th symposium on electron, ion, and laser beam technology 0 索取号：TN14-53/E801/10 作者：IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、出版社：San Francisco : San Francisco Press, [c1969].		Proceedings 0 索取号：TN1-53/E906 作者：International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、出版社：Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
	1970 Annual Symposium on Reliability : proceedings : Los Angeles, California, February 3, 4, 5, 1970 0 索取号：TN06-53/E802/1970 作者：Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、出版社：New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.		Reliability physics 1973 : 11th annual proceedings, Las Vegas, Nevada, April 3-5, 1973 0 索取号：TN06-53/E801/11 作者：International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
	Reliability physics 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 0 索取号：TN06-53/E801/10 作者：International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.		Reliability physics 1971 : 9th annual proceedings, Las Vegas, Nevada, March 31-April 2, 1971 0 索取号：TN06-53/E801/9 作者：International Reliability Physics Symposium. (9th : 1971 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、出版社：New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1971.
	Statistical sampling : past, present, and future theoretical and practical 0 索取号：作者：Symposium on Statistical Sampling (1st : 1990 : Philadelphia)、Kowalewski、 Milton J.、 1944-、Tye、 Josh B.、 1940-、ASTM Committee E-11 on Quality and Statistics.、出版社：Philadelphia, PA : ASTM, c1990.		1975 IEEE MTT-S International Microwave Symposium : digest of technical papers 0 索取号：TN019.2-7/E801/1975 作者：IEEE MTT-S International Microwave Symposium (1975 : Palo Alto、 Calif.)、Lepoff、 Jack H、Institute of Electrical and Electronics Engineers、出版社：Piscataway, N.Y. : Institute of Electrical and Electronics Engineers, c1975
	1972 IEEE - GMTT International Microwave Symposium : Digest of technical papers, May 22-24, 1972, Arlington Park Towers Hotel, Arlington Heights, IL 0 索取号：TN019.2/E806/1972 作者：IEEE-GMTT International Microwave Symposium (1972 : Arlington Heights、 IL).、Book、 Eric G.、Institute of Electrical and Electronics Engineers.、IEEE Microwave Theory and Techniques Group.、出版社：New York : Institute of Electrical and Electronics Engineers, 1972.		Semiconductor silicon 1977 : proceedings of the third International Symposium on Silicon Materials Science and Technology 0 索取号：TN304.1-53/E801/3 作者：International Symposium on Silicon Materials Science and Technology (3rd : 1977 : Philadelphia、 Pa.)、Huff、 Howard R.、Sirtl、 Erhard.、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、出版社：Princeton, N.J. : Electronics and Electrothermics and Metallurgy Divisions, Electrochemical Society, c1977.
	Boron: synthesis, structure, and properties : proceedings of the conference on Boron 0 索取号：TN304.16-53/E701 作者：International Symposium on Boron (1st : 1959 : Asbury Park、 N.J.)、GauĺЕ、 G. K. (Gerhart K.)、Nye、 W. F. (William Frederick)、 1917-、Kohn、 J. A. (Jack Arnold)、 1925-、　Institute for Exploratory Research (U.S.)、出版社：New York : Plenum Press, 1960.		Organic and polymetric materials and devices--optical, electrical and optoelectronic properties : symposium held April 1-5, 2002, San Francisco, California, U.S.A. 0 索取号：TN304.52/E20041 作者：出版社：Pittsburgh, Pa. : Materials Research Society, c2002.